moire interferometry meaning in Chinese

云纹干涉法

A study on the method of digital collecting and processing of moire interferometry image
云纹干涉图像的数字采集及处理方法的研究
In order to study the thermal performance and residual stress of microelectronic subassembly , in this paper , a newly optical interferometry method for 3 - d displacement measurement is developed based on wavefront interference theory . in which the moire interferometry provide the in - plane displacement , but the system is different from the conventional interferometry , the system applies the double diffraction of the specimen grating , the in - plane displacement sensitivity is a factor of 2 higher than that of the conventional moire interferometer . twyman / green interferometry method for out - of - plane displacement measurement is adapted , the advantages of the optical set - up are structure novelty , and the fringe patterns of the displacement fields shown high contrast and spatial resolution
为了详细研究试件的热变形特征以及残余应力的影响作用，本文在波前干涉理论的基础上，设计了一新型三维光学测试系统，该系统的平面位移测试基于云纹干涉方法，但采用与普通云纹干涉不同的光路系统，利用试件光栅和平面反射镜组形成的两次衍射，使平面位移干涉条纹倍增，测量灵敏度是普通云纹干涉的2倍，系统的离面位移场测试采用泰曼格林干涉光路。